The STM32 G0, G4, H7, L0, L4, WB and WL series have hardware support for
oversampling. This patch adds support for it, using the oversampling
value provided in the adc sequence. The result is shifted right
accordingly to not change the resolution of the measured value, like it
is done on other ADC drivers.
Signed-off-by: Aurelien Jarno <aurelien@aurel32.net>
reuse the lpc's lpadc driver for rt1170, modify the dts and add
some macro to shield some code of LPC series. Also add the
board support inside the tests/drivers/adc/adc_api/src/test_adc.c,
and a dts node:zephyr,user inside
samples/drivers/adc/boards/mimxrt1170_evk_cm7.overlay
Signed-off-by: Crist Xu <crist.xu@nxp.com>
Commit c045cbd336 added support for internal voltage reference source,
but in practice only the temp sensor is supported. Fix that.
Also change the code to keep the existing paths so that VREFINT and
TEMPSENSOR can be used at the same time.
Signed-off-by: Aurelien Jarno <aurelien@aurel32.net>
The patch fixes driver compile errors and ADC management for the f3x
series. It was developed and tested for the stm32f373 variant.
Tested-by: Dario Binacchi <dariobin@libero.it>
Signed-off-by: Dario Binacchi <dariobin@libero.it>
Convert the various device_get_binding() calls used to get the device
clock node to use DEVICE_DT_GET. The latter is processed at link time,
so it should be a bit more efficient.
Signed-off-by: Fabio Baltieri <fabiobaltieri@google.com>
it need to be a && between two condition, to satisfy
the comment: only 12 / 13 bit resolution is supported,
if FSL_FEATURE_LPADC_HAS_CMDL_MODE is not defined. not
using ||.
Signed-off-by: Crist Xu <crist.xu@nxp.com>
The STM32H7 series has a special ADC, which is calibrated
on the factory. The calibration values are stored in flash
and must be retrieved upon powering up the device.
Failure to calibrate the device leads to missing codes in
the ADC readings.
Fixes#35529
Signed-off-by: Lasse Sangild <lsangild@gmail.com>
The macros are used to get the pin(s) of a given driver instance. Add
_INST prefix to match convention used by the devicetree.h. The original
macros can now be used to obtain pin(s) of an arbitrary device instance
identified by the nodelabel.
Signed-off-by: Piotr Mienkowski <piotr.mienkowski@gmail.com>
Create the pinmux phandle to the ADC driver node in the
devicetree. When the pinmux_pin_set function in
adc_it8xxx2_channel_setup can refer to the setting of
this phandle. It is more flexible to use.
Signed-off-by: Tim Lin <tim2.lin@ite.corp-partner.google.com>
Since we removed various series headers, move stm32 driver
under main driver/pinmux folder.
Take this change into account into various drivers.
Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
In this CL, instead of a constant value, we use the length of property
'pinctrl-0' of adc0 to indicate the number of ADC channels in different
npcx series.
Signed-off-by: Mulin Chao <mlchao@nuvoton.com>
Add ADC support for the STM32WL family, this seems to work following
most of the L0X code path.
Signed-off-by: Fabio Baltieri <fabio.baltieri@gmail.com>
Simplify the the MCP320x instance initialization macro a bit by
converting it to use the new DT helper macros for SPI.
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
Simplify the LMP90xxx instance initialization macro a bit by converting
it to use the new DT helper macros for SPI and GPIO.
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
This commit it to resolve following bugs:
* Operands don't affect result.
* Logical dead code in stm32_adc driver.
Above mentioned bugs were solved by adding parenthesis and
changed the method of comparing. Since comparison of ADC
channel_id with the channel may cause loss of value.
So instead of direct comparison, introduced a mechanism to
convert channel constant to a decimal using
__LL_ADC_CHANNEL_TO_DECIMAL_NB() and strips away
the INTERNAL_CH bit and then compare with channel_id.
fix:
* zephyrproject-rtos/zephyr#35130
* zephyrproject-rtos/zephyr#35136
Signed-off-by: Affrin Pinhero <affrin.pinhero@hcl.com>
This commit fixes the ADC driver flow. And add internal
reference voltage to ADC driver API. And correct the
data buffer that only need to store raw data.
Signed-off-by: Tim Lin <tim2.lin@ite.corp-partner.google.com>
ADC emulator is designed to be used in tests on native_posix board. It
supports 1-16 bit resolution range and all GAINs from enum adc_gain.
Reference voltages and number of emulated channels are set through dts.
Using special API from drivers/adc/adc_emul.h it is possible to set
constant voltage value returned by given ADC channel or set custom
function which allows to simulate complex output.
Also reference voltages can be changed in runtime using the API.
The CL also includes:
- Add adc definitions of ADC emulator in
tests/drivers/adc/adc_api/src/test_adc.c for supporting test suites.
- Add test for ADC emulator API in tests/drivers/adc/adc_emul/
Signed-off-by: Tomasz Michalec <tm@semihalf.com>
add dma support to adc driver
add HW trigger dma support
using new dma api to request dma channel
tested on frdm_k82f and frdm_k64f
Signed-off-by: Hake Huang <hake.huang@oss.nxp.com>
This commit is about the it8xxx2 analog to digital converter
driver. Support 8 channels ch0~ch7 and 10-bit resolution.
Signed-off-by: Tim Lin <tim2.lin@ite.corp-partner.google.com>
Convert from device_get_binding to DEVICE_DT_GET. In doing this we
no longer need the label in the devicetree node so we remove that.
Removed all __ASSERT_NO_MSG(clk) since we'll get a build error if
DEVICE_DT_GET cant be satisfied, and the clock control api's will
handle reporting if the device_is_ready.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
Iterate through all lmp90xxx device instances found in the devicetree
and initialise all of them.
Fixes#32046.
Signed-off-by: Henrik Brix Andersen <hebad@vestas.com>
For multiple channels detection, channels variable was compared with
the output of find_lsb_set which actually is a decimal number.
Since channel is a bitfield the comparison was not behaving as
expected (detecting several channels while only one channel was used).
Rework the code to use the already existing bitfield "index" for
the test.
Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
The STM32 driver currently does not support reading a sequence of
multiple ADC channels. Only the first channel of the sequence was
read and the rest was silently ignored.
Fix: Return an error if reading multiple channels is requested.
Signed-off-by: Martin Jäger <martin@libre.solar>
Now that we generate a header that extern's all possible devicetree
based device struct we can remove DEVICE_DT_DECLARE and
DEVICE_DT_INST_DECLARE as they aren't needed anymore.
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
Adds support for ADC on G0 series.
Simple implementation: sequencer not fully configurable,
and only one common sampling time.
Signed-off-by: Thomas Stranger <thomas.stranger@outlook.com>
Convert adc drivers to use new DT variants of the DEVICE APIs.
DEVICE_AND_API_INIT -> DEVICE_DT_DEFINE
DEVICE_GET -> DEVICE_DT_GET
DEVICE_DECLARE -> DEVICE_DT_INST_DECLARE
etc..
Signed-off-by: Kumar Gala <kumar.gala@linaro.org>
This CL replaces all DT_ prefix with NPCX_DT_ for all macros used
for providing npcx device information in soc_dt.h It avoided the
ambiguity with the DT_ prefix for system DT macros/defines.
Signed-off-by: Mulin Chao <mlchao@nuvoton.com>
NPCX7 includes a 10-bit resolution Analog-to-Digital Converter (ADC). Up
to 10 voltage inputs can be measured and a internal voltage reference
(VREF), 2.816V (typical) is used for measurement. It can be triggered
automatically in Autoscan mode. Each input channel is assigned a
separate result register, which is updated at the end of the conversion.
The CL also includes:
— Add npcx adc device tree declarations.
— Zephyr adc api implementation.
— Add adc definitions of npcx7 in
tests/drivers/adc/adc_api/src/test_adc.c for supporting test suites.
Signed-off-by: Mulin Chao <MLChao@nuvoton.com>
Channels 4..7 are multiplexed on adc16. The NXP HAL exposes
ADC16_SetChannelMuxMode but this function is not yet included
in Zephy. The following patch adds channel-mux-b to the dts
enabling the use of the alternate channels of 16 bit adc.
Signed-off-by: Andreas Dröscher <github@anticat.ch>
Set stm32_dt_pinctrl_configure function as the unique entry point
to STM32 DT pinctrl management.
Signed-off-by: Erwan Gouriou <erwan.gouriou@linaro.org>
ADC shell commands can be only executed on the property label
existing in the device tree. It is realized by the dynamic subcommand
returning existing ADC Label.
Signed-off-by: Jakub Rzeszutko <jakub.rzeszutko@nordicsemi.no>
The channel command has been extended with subcommands: id, positive,
and negetive. Some boards require positive input configuration before
measurement can be started.
Signed-off-by: Jakub Rzeszutko <jakub.rzeszutko@nordicsemi.no>
Use dedicated shell macros so argument count can be validated before
the command handler is executed. This change simplifies the command
handlers implementation inside the adc_shell file.
Signed-off-by: Jakub Rzeszutko <jakub.rzeszutko@nordicsemi.no>
Changed gain and reference commands to dictionary commands.
This change removes an obsolete look-up table (string <-> value)
for gain and reference commands.
Now, each modification of gain or reference value will require only
a dictionary command update.
Signed-off-by: Jakub Rzeszutko <jakub.rzeszutko@nordicsemi.no>
This part of common code for ADC drivers, the adc_context_enable_timer()
function, was still converting sampling interval values to milliseconds
(the only option available at the time this code has been created) when
setting up the kernel timer, consequently limiting the maximum sampling
frequency to 1000 samples per second. This patch switches the routine
to specifying the interval in microseconds, to remove this limitation.
Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>