Convert them to native YAML lists. Support for space-separated
lists was deprecated in Twister a long time ago.
Signed-off-by: Gerard Marull-Paretas <gerard.marull@nordicsemi.no>
Add support for setting the sample frequency via `attr_set` and the
output data rate from device tree source.
Signed-off-by: Jeppe Odgaard <jeppe.odgaard@prevas.dk>
Add build tests for the IT8801 MFD drivers, including GPIO,
Input and PWM functionalities.
GPIO, Input test: west build -p always -b native_sim
PWM test: west build -p always -b it82xx2_evb
Signed-off-by: Tim Lin <tim2.lin@ite.corp-partner.google.com>
For the inverted pulse measurements, that should reflect
the duty-cycle off interval, the 1% deviation in test_capture
should be adjusted so it reflects duty-cycle off.
Signed-off-by: Ioannis Karachalios <ioannis.karachalios.px@renesas.com>
As per the PWM API definition, -EBUSY should be returned
when pwm_enable_capture is called and capturing
is already enabled. This commit deals with adding
a ztest_suite_before_t function that should disable
capturing at the end of a single test. Some tests, though,
such as test_pulse_capture, execute two sub-tests
and so, capturing is disabled in between. In fact, the omission
of pwm_disable_capture should not only result in aborting
a single test, but it can also raise system exception
due to invalid context. This is the case for
z_impl_pwm_capture_cycles where z_pwm_capture_cycles_callback
can be fired whilst the routine has already aborted and so
struct z_pwm_capture_cb_data data, defined within function
declaration, should not longer be valid.
Signed-off-by: Ioannis Karachalios <ioannis.karachalios.px@renesas.com>
Instead of writing to existing fake APIs, use dummy devices with empty
APIs. This allows us to place APIs in ROM.
Signed-off-by: Pieter De Gendt <pieter.degendt@basalte.be>
Rename "nxp,kinetis-wdog32" compatible to "nxp,wdog32" to remove the
device family from its name.
Signed-off-by: Manuel Argüelles <manuel.arguelles@nxp.com>
Tests the ADC clock domain on the stm32g0 serie
Possible ADC clock sources are SYStem clock (default) or PLL_P.
No clock source HSI for the ADC tested here.
Signed-off-by: Francois Ramu <francois.ramu@st.com>
Separate the current driver for the FPGA iCE40 into two different ones.
One implements only the SPI load mode, the other one only the GPIO
bitbang mode.
Signed-off-by: Benedikt Schmidt <benedikt.schmidt@embedded-solutions.at>
Disabled data caching for nRF54H20dk in wdt_basic_api test.
It caused variables stored in noinit section to be cached,
resulting in reset loop.
Signed-off-by: Michał Stasiak <michal.stasiak@nordicsemi.no>
This commit refactos set_actual_position to set_reference_position.
stepper_set_reference_position is more apt in regards to what this func
actually does
Signed-off-by: Jilay Pandya <jilay.pandya@outlook.com>
The #81456 fixed the driver issue related to issue #81454. This add
the RTC configurations on sam_v71_xult board to enable test coverage.
Fixes#81454
Signed-off-by: Gerson Fernando Budke <nandojve@gmail.com>
Add devicetree node for code RAM, code RAM can be accessed
over AIXM bus or AXIF bus. Code access via AXIF interface
provides the best optimal performance
Signed-off-by: Dat Nguyen Duy <dat.nguyenduy@nxp.com>
Don't duplicate the test's output running it on `native_sim` after
`LOG_BACKEND_NATIVE_POSIX` was enabled by default (bd9836be8c)
Signed-off-by: Dmitrii Golovanov <dmitrii.golovanov@intel.com>
This fixes memory corruption of delayable work when
tests executes unsupported function.
When test (e.g. only_rx_in_chunks) is executed it starts
delayed work for master functionality (with 10 ms delay).
Later when slave function is tried and reports that
function is unsupported, test is terminated (task ends)
but work is still scheduled.
When next test starts it clears work that is already
scheduled:
static void before(void *not_used)
{
ARG_UNUSED(not_used);
memset(&tdata, 0, sizeof(tdata));
this leads to memory corruption and system work queue
tries to remove work but it never does since head/next
pointers are zeroed at that time.
This just adds after function that cancels work
regardless if it was scheduled or not.
Signed-off-by: Jerzy Kasenberg <jerzy.kasenberg@codecoup.pl>
This is a follow-up to 21475774fc,
extending the number of tests and samples that use the new L05 and L10.
Signed-off-by: Carles Cufi <carles.cufi@nordicsemi.no>
Use a string for the mipi-mode property over an integer value, as this
significantly improves the readability of the MIPI DBI device binding.
Signed-off-by: Daniel DeGrasse <daniel.degrasse@nxp.com>
flash_copy() is performed on a page.size span but following flash_read()
verification step is performed on EXPECTED_SIZE length (512).
This doesn't work on devices where page.size is lower than EXPECTED_SIZE,
such as STM32L1 where page size is 256.
To fix this, perform verification on the smalest value between page.size
and EXPECTED_SIZE.
Signed-off-by: Erwan Gouriou <erwan.gouriou@st.com>
Enable this test in the simulated nrf5340 and provide
an appropriate overlay.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Enable this test in the simulated nrf54l15 and provide
an appropriate overlay.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Enable this test in the simulated nrf54l15 by providing
an appropriate overlay.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Add second instance to be tested on nrf54h20dk. uart120 is a fast UARTE
which works on fixed pin locations. It is not available for cpuppr core.
Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
