Move negative tests for flash driver to a separate test suite.
Run negative tests only on platforms that are aligned.
Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
This commit moves the test buffer from ITCM (not accessible by DMA) to DTCM
on several NXP boards, to make the test successful.
Signed-off-by: Mathieu Choplain <mathieu.choplain@st.com>
This commit places the chan_blen_transfer DMA test's TX and RX buffers
in a separate file that gets entirely relocated. This ensures that the
buffers reside in the correct memory, without breaking other things
due to relocation of test data/code.
Fixes#75676.
Signed-off-by: Mathieu Choplain <mathieu.choplain@st.com>
Fix compilation by providing an overlay file for cpuapp.
Signed-off-by: Emanuele Di Santo <emdi@nordicsemi.no>
Co-authored-by: Andreas Moltumyr <andreas.moltumyr@nordicsemi.no>
Fix compilation by defining the watchdog flags for nRF9280 as well.
Signed-off-by: Emanuele Di Santo <emdi@nordicsemi.no>
Co-authored-by: Andreas Moltumyr <andreas.moltumyr@nordicsemi.no>
Currently this code related to how to configure the
flash size and address when using flexspi to XIP is copy
pasted in all sort of places and ways all over the tree,
let's clean this up and have single point of control over
this configuration.
Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
Fix warnings generated when performing sensor drivers build test
due to typos in i2c DT definition.
Signed-off-by: Armando Visconti <armando.visconti@st.com>
Add macros for converting between Max Packet Size and total payload
length. Allow drivers specify whether endpoint supports high-bandwidth
interrupt and high-bandwidth isochronous transfers.
Signed-off-by: Tomasz Moń <tomasz.mon@nordicsemi.no>
wMaxPacketSize in endpoint descriptor is stored in little-endian order,
but the mps parameter passed to functions is in host order.
Signed-off-by: Tomasz Moń <tomasz.mon@nordicsemi.no>
Add missing braces to comply with MISRA C:2012 Rule 15.6 and
also following Zephyr's style guideline.
Signed-off-by: Pisit Sawangvonganan <pisit@ndrsolution.com>
Add functional test for flash_erase().
Add negative tests for flash_read(), flas_write(), flash_erase(),
flash_fill() and flash_flatten().
Add functional test for flash page layout.
Signed-off-by: Sebastian Głąb <sebastian.glab@nordicsemi.no>
Writing directly to Px_DATA_REG modifies pins which are not
indicated by mask, causing gpio_basic_api test to fail.
Use Px_SET_DATA_REG and Px_RESET_DATA_REG to modify only
pins indicated by mask.
Signed-off-by: Ioannis Damigos <ioannis.damigos.uj@renesas.com>
native_posix is being deprecated, let's switch this test to native_sim
instead.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
native_posix is being deprecated, let's switch this test to native_sim
instead.
Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
Add DMA channels to test overlay files as DMA support is now available
for MAX32 I2C driver.
Signed-off-by: Tahsin Mutlugun <Tahsin.Mutlugun@analog.com>
SPI pins are defined in board.dts file to simplify usage
so that no need to redefine it in overlay files
Signed-off-by: Sadik Ozer <sadik.ozer@analog.com>
Enable SPI test for MAX32662EVKIT.
SRAM size increased to get enough space for SPI test image
Co-Authored-By: Sadik Ozer <sadik.ozer@analog.com>
Signed-off-by: Furkan Akkiz <hasanfurkan.akkiz@analog.com>
