Commit graph

16700 commits

Author SHA1 Message Date
Andrej Butok
e53eec0851 yaml: use EXTRA_CONF_FILE in .yaml files
Use EXTRA_CONF_FILE in sample yaml files,
that replaced deprecated OVERLAY_CONFIG
since the Zephyr v3.4 release.

Signed-off-by: Andrej Butok <andrey.butok@nxp.com>
2024-10-17 09:45:25 +02:00
Ibe Van de Veire
e6dd4cda89 test: net: igmp: Add extra IGMPv3 testcase
Added extra testcases for the IGMPv3 protocol. The IGMP driver is
supposed to send an IGMPv3 report when joining a group.

Signed-off-by: Ibe Van de Veire <ibe.vandeveire@basalte.be>
2024-10-17 09:44:33 +02:00
Dominik Ermel
3e8ea52e21 tests/flash/common: Increase ztest stack size
The commit sets CONFIG_ZTEST_STACK_SIZE to 4096.

Fixes #79801

Signed-off-by: Dominik Ermel <dominik.ermel@nordicsemi.no>
2024-10-17 09:43:40 +02:00
Jamie McCrae
b5b335ef6e tests: drivers: build_all: eeprom: Add nrf9131ek Kconfig fragment
Adds a Kconfig fragment which changes the MFD init priority

Signed-off-by: Maximilian Deubel <maximilian.deubel@nordicsemi.no>
Signed-off-by: Jamie McCrae <jamie.mccrae@nordicsemi.no>
2024-10-16 16:37:12 +01:00
Andrzej Głąbek
edc4f75b61 soc: nordic: Fix the way of enabling clock control for nRF54H Series
This is a follow-up to commit 7a2ce2882a.

Do not enable clock control by default on nRF54H Series SoCs when
the system timer is present, because clock control is not needed
for this purpose there.

Add missing `default y` in the CLOCK_CONTROL_NRF2 Kconfig option that
enables compilation of clock control drivers for nRF54H Series.
This way modules that actually require clock control (like drivers
that use radio) will be able to enable it using the generic option
(CLOCK_CONTROL), not the above one that is specific for nRF54H.

Update accordingly applications that referenced the CLOCK_CONTROL_NRF2
option.

Signed-off-by: Andrzej Głąbek <andrzej.glabek@nordicsemi.no>
2024-10-16 16:36:51 +01:00
alperen sener
a5010504bc tests: bluetooth: tester: Add nrf54l15dk and remove nrf54l15pdk
Rename the config files according to nrf54l15dk.

Signed-off-by: alperen sener <alperen.sener@nordicsemi.no>
2024-10-16 16:35:32 +01:00
Chris Friedt
45b3010d74 tests: posix: net: fix missing clock_t and clockid_t with newlib
Fix errors found in CI for missing clock_t and clockid_t types
when building the tests/posix/net testsuite.

Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
2024-10-16 16:32:51 +01:00
TOKITA Hiroshi
8c705cabab tests: drivers: build_all: Add a build_all test for wifi
The test targets the following devices at this time.

- atmel,winc1500
- inventek,eswifi
- inventek,eswifi-uart

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-16 12:27:05 +02:00
Jordan Yates
0fb63c05d1 tests: random: rng: validate sys_csrand_get availability
Validate that `sys_csrand_get` is available when `TEST_RANDOM_GENERATOR`
is enabled.

Signed-off-by: Jordan Yates <jordan@embeint.com>
2024-10-16 10:00:47 +02:00
Sylvio Alves
5a205518a6 tests: drivers: counter: fix no_alarm use case
In the test scenario without alarms, it might
be the case that counter is already running and
it will not match the expected tick.
This adds a tick offset into the expected value
based on current counter reading.

Signed-off-by: Sylvio Alves <sylvio.alves@espressif.com>
2024-10-16 09:58:47 +02:00
Neil Chen
0fa766c8ea tests: drivers/regulator/voltage: Add regulator test for NXP frdm_mcxn236
Support regulator(vref) output vt oltage test for NXP frdm_mcxn236

Signed-off-by: Neil Chen <cheng.chen_1@nxp.com>
2024-10-16 09:57:49 +02:00
Neil Chen
a6b414d46b tests: drivers/adc/adc_api: Support adc api test for NXP frdm_mcxn236
Support adc api test for NXP frdm_mcxn236

Signed-off-by: Neil Chen <cheng.chen_1@nxp.com>
2024-10-16 09:57:49 +02:00
Gerard Marull-Paretas
eb45da5a44 tests: pwm_api: enable dma_fast_region in nRF54H20 DK overlay
The overlay makes use of the dma_fast_region without enabling it.

Signed-off-by: Gerard Marull-Paretas <gerard@teslabs.com>
2024-10-16 09:55:08 +02:00
Hake Huang
193bfabd3f tests: uart_async_api: update test for dma usage
1. ensure the two dma buffers all aligned with 32 bits
2. clean the rx_data_idx at test begin

Signed-off-by: Hake Huang <hake.huang@oss.nxp.com>
2024-10-15 19:09:19 -04:00
Sreeram Tatapudi
23f3cb1977 samples: subsys: fs: littlefs: add overlay files for CYW20829
Use littlefs to store logs to flash memory

Signed-off-by: Sreeram Tatapudi <sreeram.praveen@infineon.com>
2024-10-15 21:04:38 +01:00
Adam Kondraciuk
dd7cfbc92e test: drivers: pwm: add fast PWM
Add fast PWM instance for nRF54H20 device.

Signed-off-by: Adam Kondraciuk <adam.kondraciuk@nordicsemi.no>
2024-10-15 19:08:03 +01:00
Krzysztof Chruściński
5371effda8 tests: boards: nrf: qdec: Add device runtime PM configuration
Add configuration to the test which is using runtime PM on qdec.

Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
2024-10-15 19:06:01 +01:00
Krzysztof Chruściński
7fc73619b4 tests: boards: nrf: qdec: Add common configuration for nrf54l
Add common overlay for nrf54l15pdk targets.

Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
2024-10-15 19:06:01 +01:00
Stoyan Bogdanov
6ec8a53c9b tests: drivers: build_all: gpio: Correct max14906 and max14916 compat
Replace wrong compatibility strings for max14906 and max14916.
Fix wrong addressees for max14906 and max14916.

Signed-off-by: Stoyan Bogdanov <sbogdanov@baylibre.com>
2024-10-15 19:04:10 +01:00
Tomasz Moń
7c7383cabf tests: usb: uac2: Test Feature Unit descriptor
Insert Feature Units in between:
  * USB Streaming Input Terminal and Headphones Output Terminal
  * Microphone Input Terminal and USB Streaming Output Terminal

The Feature Units have Mute control only on the Primary channel 0.
The headphones Feature Unit also has Automatic Gain control on all
channels while microphone Feature Unit has Automatic Gain control only
on the Logichal channel 1.

Signed-off-by: Tomasz Moń <tomasz.mon@nordicsemi.no>
2024-10-15 19:03:49 +01:00
Jilay Pandya
abf5520a19 test: drivers: stepper: adjust tests as per the new api
This commit adjusts the tests as per the updated stepper api.

Signed-off-by: Jilay Pandya <jilay.pandya@zeiss.com>
2024-10-15 13:53:16 +02:00
Szymon Janc
4a3807789d bluetooth: tester: Enable support for writable appearance
This was affecting GAP/GAT/BV-06-C qualification test.

Signed-off-by: Szymon Janc <szymon.janc@codecoup.pl>
2024-10-15 13:53:03 +02:00
Robert Lubos
45a79d3208 tests: net: conn_mgr_monitor: Improve test reliability under heavy load
conn_mgr_tests were occasionally failing when executed under heavy load.
The reason for this are short timeout values used when waiting for
events - if executed under heavy load, the even might not be delivered
on time.

An obvious solution would be to simply increase the timeout, however
when testing it turned out the actual timeout value would need to be
pretty high to ensure tests reliability. Therefore, to avoid
unnecessary increase of the overall test execution time to protect
against rare edge cases, rework the event waiting mechanism to use
semaphore instead. The test cases will now specify the events they're
waiting for, and the event handlers will feed the semaphore if all
expected events have been delivered. This allows the increase the
maximum timeout when waiting for events, w/o affecting too much the test
execution time under normal conditions.

Signed-off-by: Robert Lubos <robert.lubos@nordicsemi.no>
2024-10-15 13:52:24 +02:00
Rodrigo Peixoto
9105b1937e tests: zbus: fix ci by excluding m2gl025_miv board
The `m2gl025_miv` is breaking the ci during the zbus integration tests. To
solve that in a meanwhile, this commit excludes the board from the
zbus integration tests.

Signed-off-by: Rodrigo Peixoto <rodrigopex@gmail.com>
2024-10-15 04:27:26 -04:00
Daniel Leung
bda38f033a tests: mem_map: fix memory exhaustion test on qemu_x86_tiny
The test_k_mem_map_unmap test requires some free physical pages
to work correctly. On qemu_x86_tiny, the physical memory is
artificially limited to test demand paging, which is 320KB as
of writing of this commit message. We also reserve 128KB of
physical memory as swapping area. And we do pin quite lot of
text and data (relatively speaking) in memory. There is not
much memory left for the test. So lower the amount of reserved
memory for paging to leave some pages for the test.

Signed-off-by: Daniel Leung <daniel.leung@intel.com>
2024-10-15 04:12:25 -04:00
Joel Hirsbrunner
405c6718ed Devicetree: Devicetree Bindings: Add tests for new DT_ENUM_ macros
Test the new c-macros for dt enums. The new macros are already used in
the existing macros. As an example, DT_ENUM_IDX(node_id, prop) uses
DT_ENUM_IDX_BY_IDX(node_id, prop, 0) to get its result. However, this is
insufficient for testing the complete functionality of these macros.
Therefore, additional tests are added to make sure they work
appropriately for other indices besides 0.

Signed-off-by: Joel Hirsbrunner <jhirsbrunner@baumer.com>
2024-10-15 04:11:36 -04:00
Grzegorz Swiderski
85b03949e4 boards: nordic: Flatten shared_ramxx_region nodes
Update the default memory maps for `nrf54h20dk` and `nrf9280pdk` to
remove the `shared_ram20_region` and `shared_ram3x_region` nodes,
because their child nodes no longer need to be grouped together:

  * IPC buffers in RAM20 are statically allocated.
  * DMA buffers in RAM3x have separate access owners.

Signed-off-by: Grzegorz Swiderski <grzegorz.swiderski@nordicsemi.no>
2024-10-15 04:11:21 -04:00
Grzegorz Swiderski
13b1cfa5ec boards: nordic: Align with updated Nordic owned memory bindings
Apply the following changes to `nrf54h20dk` and `nrf9280pdk`:

* Convert `perm-*` properties to the newly introduced `nordic,access`,
  both in board files and tests.

* Redefine shared regions to specify multiple access owners per node,
  and ensure that each such region is reserved by one domain at a time.
  `cpuapp_cpurad_ram0x_region` is only enabled by Radiocore, while
  `cpuapp_cpucell_ram0x_region` is only enabled by Application core.

* Divide `shared_ram3x_region` so that each sub-region is owned by a
  different domain. Their addresses must be rounded down to fit the
  current UICR format.

Signed-off-by: Grzegorz Swiderski <grzegorz.swiderski@nordicsemi.no>
2024-10-15 04:11:21 -04:00
Paweł Czaplewski
217fdf9d24 tests: drivers: i2c: fix I2C registers configuration in i2c.dtsi
Fixed incorrect I2C register definitions in the test file
tests/drivers/build_all/sensor/i2c.dtsi.

Signed-off-by: Paweł Czaplewski <pawel.czaplewski@arrow.com>
2024-10-15 04:10:40 -04:00
Paweł Czaplewski
9fe959857a drivers: sensor: tmp1075: Add tmp1075 sensor driver and sample
TI tmp1075 driver implemented based on tmp108 driver.
The driver initializes the sensor based on the DTS.

Added tmp1075 example overlay file to thermometer sample.
All you need to do to use the sensor is to connect the I2C and
optionally interrupt line.
To see default DTS configuration option inspect `ti,tmp1075.yaml`
bindings file and sensor spec.

Signed-off-by: Paweł Czaplewski <pawel.czaplewski@arrow.com>
2024-10-15 04:10:40 -04:00
Emil Gydesen
cd5a9f62bb tests: Bluetooth: CCID: Add unit testing of CCID
Add unit tests of the CCID functions.
To support these new tests, the GATT mocks need to
support dynamic GATT DB so we can add and remove
a service that contains CCIDs.

Signed-off-by: Emil Gydesen <emil.gydesen@nordicsemi.no>
2024-10-15 04:10:28 -04:00
TOKITA Hiroshi
0ce32c963e tests: drivers: build_all: lora: Add devices build tests
Add build tests for the following devices.

- semtech,sx1262
- semtech,sx1272
- reyax,rylrxxx

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-15 04:09:56 -04:00
Erik Sandgren
5f59b35b42 Bluetooth: Host: Fix issue where uninitialized value was used
This change makes sure that when a call to `bt_id_set_scan_own_addr` is
sucessful, i.e., the return value is 0, the `own_addr_type` will
be set by the `bt_id_set_scan_own_addr`.

Not setting the `own_addr_type` in a successful call to
`bt_id_set_scan_own_addr` causes, for example,
the `start_le_scan_ext` method in `scan.c` to use an
uninitialized `own_addr_type`.

Eventually this results in an unexpected failure further down in
`start_le_scan_ext`, when sending HCI command to controller with
an uninitialized `own_addr_type`.

Signed-off-by: Erik Sandgren <erik.sandgren@nordicsemi.no>
2024-10-15 04:07:50 -04:00
Emil Gydesen
730b2f7c69 Bluetooth: Tester: Force initial conn param to 30ms
Modify the GAP connect to use 30ms. The default parameters
typically ended up with 50ms which is OK in most cases,
but for ISO related test cases, using an ACL interval that
is a multiple of the ISO SDU interval (7.5/10ms) generally
provides better stability. 30ms is the lowest multiple
of both 7.5 and 10ms, and was thus chosen.

Signed-off-by: Emil Gydesen <emil.gydesen@nordicsemi.no>
2024-10-15 04:06:53 -04:00
Nick Ward
89b7336876 net: openthread: make receive sensitivity configurable
OpenThread route cost calculations are dependent on this
being accurate for the hardware design.

Signed-off-by: Nick Ward <nix.ward@gmail.com>
2024-10-15 04:06:08 -04:00
Lucien Zhao
4db46a3331 tests: drivers: counter_basic_api: add qtmr1_timer0 configuration
add qtmr1_timer0 configuration for counter_basic_api case

Signed-off-by: Lucien Zhao <lucien.zhao@nxp.com>
2024-10-15 04:37:47 +01:00
Jordan Yates
4361c96c48 adc: current_sense_amplifier: resistance in milli-ohms
Change the unit of the sense resistor in the devicetree binding from
micro-ohms to milli-ohms. This is done for three reasons.

Firstly, the maximum value resistor that can currently be represented
is 4.2 kOhms, due to the limitation of devicetree properties to 32 bits.

Secondly, storing the resistance at such a high resolution makes
overflows much more likely when the desired output unit is micro-amps,
not milli-amps.

Finally, micro-ohms, are an unnecessarily precise unit for the purpose
of these calculations, and a resolution that is not realistic to
achieve. The high resistor resolution results in large divisors that
reduce the resolution of outputs. Unlike resistors characterised down to
the micro-ohm, devices wanting to measure micro-amps are actually
realistic.

Signed-off-by: Jordan Yates <jordan@embeint.com>
2024-10-14 13:05:07 +02:00
Lars Knudsen
e0a262b33f Bluetooth: Audio: Fix initial Broadcast source values
If the Broadcast ID is initially set to 0x000000,
which is valid, comparison logic on add of an
actual Broadcast ID of 0x000000 fails.

Likewise for SID.

Moving INVALID_BROADCAST_ID define to bap.h

Signed-off-by: Lars Knudsen <LAKD@demant.com>
2024-10-14 13:04:31 +02:00
Emil Gydesen
0ed799aa14 tests: Bluetooth: Audio: Modify/add compile.sh for audio samples
Instead of having one large compile.sh for all audio samples,
it has been split into multiple. This makes it easier to
build and run specific tests (e.g. BAP or CAP), without
having to build all of them.

This also makes it easier to expand later, without
creating one huge compile.sh file.

Signed-off-by: Emil Gydesen <emil.gydesen@nordicsemi.no>
2024-10-14 13:03:57 +02:00
Declan Snyder
6be08222c0 boards: frdm_mcxw71: Enable mcuboot
Enable mcuboot partitions

Signed-off-by: Declan Snyder <declan.snyder@nxp.com>
2024-10-14 13:03:39 +02:00
Alberto Escolar Piedras
9e7785f323 tests/bsim/bluetooth/ll/edtt: Dont use deprecated global_device_nbr
Use the provided API to get it instead

Signed-off-by: Alberto Escolar Piedras <alberto.escolar.piedras@nordicsemi.no>
2024-10-14 13:03:19 +02:00
Robert Lubos
c4803752a8 net: Deprecate CONFIG_NET_SOCKETS_POLL_MAX
CONFIG_ZVFS_POLL_MAX is now used to control the maximum number of poll()
entires. Thereby, CONFIG_NET_SOCKETS_POLL_MAX is redundant and shall
be deprecated.

Modify the defaults for NET_SOCKETS_POLL_MAX and ZVS_POLL_MAX so that
the deprecation actually makes sense instead of symbol removal. In case
the application still sets the old config, it will modify the
ZVS_POLL_MAX default.

Signed-off-by: Robert Lubos <robert.lubos@nordicsemi.no>
Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
2024-10-14 13:01:51 +02:00
Chris Friedt
748252aa76 posix: device_io: use mode argument correctly in open()
Previously, we had only used the flags field and ignored mode
with the open() function.

Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
2024-10-14 13:01:51 +02:00
Chris Friedt
1715196cff posix: device_io: implement pselect()
Implement pselect() as it's required by POSIX_DEVICE_IO

Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
2024-10-14 13:01:51 +02:00
Chris Friedt
b3d3d4fff7 net: sockets: move select() implementation to zvfs
Move the implementation of zsock_select() to zvfs_select(). This
allows other types of file descriptors to also make use of
select() functionality even when the network subsystem is not
enabled.

Additionally, it partially removes a dependency cycle between
posix and networking by moving functionality into a mutual
dependency.

Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
2024-10-14 13:01:51 +02:00
Chris Friedt
881dc1fa7a net: sockets: move poll implementation to zvfs
Move the implementation of zsock_poll to zvfs_poll. This allows
other types of file descriptors to also make use of poll()
functionality even when the network subsystem is not enabled.

Additionally, it partially removes a dependency cycle between
posix and networking by moving functionality into a mutual
dependency.

Signed-off-by: Chris Friedt <cfriedt@tenstorrent.com>
2024-10-14 13:01:51 +02:00
Yonatan Schachter
31fe9645ea tests: Add tests for bindesc reading
Added tests for bindesc reading, to test reading on multiple C/C++
standards. Only RAM and flash backends are tested, as the flash
simulator can't simulate a memory mapped flash.

Signed-off-by: Yonatan Schachter <yonatan.schachter@gmail.com>
2024-10-11 13:20:49 -04:00
Jordan Yates
8746a2aa12 tests: fs: fat_fs_api: add timestamp integration
Add an example implementation of `get_fattime` to the API tests. Also
ensure that `FS_FATFS_EXTRA_NATIVE_API` compiles in a test.

Signed-off-by: Jordan Yates <jordan@embeint.com>
2024-10-11 13:20:08 -04:00
Sudan Landge
67f3d0b923 tests: kernel: smp: Test cpu affinity with custom ROM offset
What is the changed?
CPU affinity test for SMP cores will now cover a change in ROM offset.

How is it changed?
Add a new testcase section with ROM offset set to something other than
the default 0.

Why is it change?
There is no test to cover the issue reported in #76182 and the cpu
affinity test is the closest to test the issue. Adding a new testcase
will makes sure there is no breaking change in the future.

Signed-off-by: Sudan Landge <sudan.landge@arm.com>
2024-10-11 13:17:25 -04:00
TOKITA Hiroshi
eebed141cf tests: drivers: build_all: Add a build_all test for flash
The test targets the following devices at this time.

- atmel,at45
- jedec,spi-nor

Signed-off-by: TOKITA Hiroshi <tokita.hiroshi@gmail.com>
2024-10-11 13:16:53 -04:00