drivers: sensor: ina237: fix current sign issue
Fix current sign extension logic and consolidate sensor scaling code into a single block. Signed-off-by: Eric Holmberg <eric.holmberg@northriversystems.co.nz>
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19da119c17
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2d3a391191
3 changed files with 47 additions and 35 deletions
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@ -31,58 +31,36 @@ LOG_MODULE_REGISTER(INA237, CONFIG_SENSOR_LOG_LEVEL);
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*/
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#define INA237_DIETEMP_TO_uDegC(x) (((x) >> 4) * 125000)
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static void micro_s32_to_sensor_value(struct sensor_value *val, int32_t value_microX)
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{
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val->val1 = value_microX / 1000000L;
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val->val2 = value_microX % 1000000L;
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}
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static int ina237_channel_get(const struct device *dev, enum sensor_channel chan,
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struct sensor_value *val)
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{
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struct ina237_data *data = dev->data;
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const struct ina237_data *data = dev->data;
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const struct ina237_config *config = dev->config;
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uint32_t bus_uv, current_ua, power_uw;
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int32_t temp_uDegC;
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int32_t sign = 1;
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switch (chan) {
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case SENSOR_CHAN_VOLTAGE:
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bus_uv = INA237_BUS_VOLTAGE_TO_uV(data->bus_voltage);
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val->val1 = bus_uv / 1000000U;
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val->val2 = bus_uv % 1000000U;
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micro_s32_to_sensor_value(val, INA237_BUS_VOLTAGE_TO_uV(data->bus_voltage));
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break;
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case SENSOR_CHAN_CURRENT:
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if (data->current & INA23X_CURRENT_SIGN_BIT) {
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current_ua = ~data->current + 1U;
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sign = -1;
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} else {
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current_ua = data->current;
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sign = 1;
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}
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/* see datasheet "Current and Power calculations" section */
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current_ua = current_ua * config->current_lsb;
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/* convert to fractional amperes */
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val->val1 = sign * (int32_t)(current_ua / 1000000U);
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val->val2 = sign * (int32_t)(current_ua % 1000000U);
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micro_s32_to_sensor_value(val, data->current * config->current_lsb);
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break;
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case SENSOR_CHAN_POWER:
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/* see datasheet "Current and Power calculations" section */
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power_uw = (data->power * INA237_POWER_SCALING * config->current_lsb) / 10000U;
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/* convert to fractional watts */
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val->val1 = (int32_t)(power_uw / 1000000U);
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val->val2 = (int32_t)(power_uw % 1000000U);
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micro_s32_to_sensor_value(val,
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(data->power * INA237_POWER_SCALING * config->current_lsb) / 10000U);
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break;
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case SENSOR_CHAN_DIE_TEMP:
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temp_uDegC = INA237_DIETEMP_TO_uDegC(data->die_temp);
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val->val1 = temp_uDegC / 1000000L;
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val->val2 = abs(temp_uDegC) % 1000000L;
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if (temp_uDegC < 0) {
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val->val2 = -val->val2;
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}
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micro_s32_to_sensor_value(val, INA237_DIETEMP_TO_uDegC(data->die_temp));
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break;
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default:
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@ -37,7 +37,7 @@
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struct ina237_data {
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const struct device *dev;
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uint16_t current;
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int16_t current;
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uint16_t bus_voltage;
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uint32_t power;
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int16_t die_temp;
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@ -44,6 +44,39 @@ ZTEST(ina237_0, test_default_config)
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*
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* @param fixture
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*/
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static void test_current(struct ina237_fixture *fixture)
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{
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/* 16-bit signed value for current register */
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const int16_t current_reg_vectors[] = {
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32767,
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1000,
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100,
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1,
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0,
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-1,
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-100,
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-1000,
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-32768,
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};
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for (int idx = 0; idx < ARRAY_SIZE(current_reg_vectors); idx++) {
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struct sensor_value sensor_val;
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int16_t current_register = current_reg_vectors[idx];
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double current_expected_A = fixture->current_lsb_uA * 1e-6 * current_register;
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/* set current reading */
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ina237_mock_set_register(fixture->mock->data, INA237_REG_CURRENT, current_register);
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/* Verify sensor value is correct */
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zassert_ok(sensor_sample_fetch(fixture->dev));
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zassert_ok(sensor_channel_get(fixture->dev, SENSOR_CHAN_CURRENT, &sensor_val));
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double current_actual_A = sensor_value_to_double(&sensor_val);
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zexpect_within(current_expected_A, current_actual_A, fixture->current_lsb_uA*1e-6,
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"Expected %.6f A, got %.6f A", current_expected_A, current_actual_A);
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}
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}
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static void test_bus_voltage(struct ina237_fixture *fixture)
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{
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zassert_not_null(fixture->mock);
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@ -128,6 +161,7 @@ static struct ina237_fixture fixtures[] = {
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/* Create a test suite for each enabled ina237 device node */
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#define INA237_TESTS(inst) \
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ZTEST(ina237_##inst, test_current) { test_current(&fixtures[inst]); } \
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ZTEST(ina237_##inst, test_bus_voltage) { test_bus_voltage(&fixtures[inst]); } \
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ZTEST(ina237_##inst, test_temperature) { test_temperature(&fixtures[inst]); } \
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ZTEST_SUITE(ina237_##inst, NULL, NULL, NULL, NULL, NULL);
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