diff --git a/drivers/sensor/ina23x/ina237.c b/drivers/sensor/ina23x/ina237.c
index 183e1079d90..987d0e5c0b1 100644
--- a/drivers/sensor/ina23x/ina237.c
+++ b/drivers/sensor/ina23x/ina237.c
@@ -31,58 +31,36 @@ LOG_MODULE_REGISTER(INA237, CONFIG_SENSOR_LOG_LEVEL);
  */
 #define INA237_DIETEMP_TO_uDegC(x) (((x) >> 4) * 125000)
 
+static void micro_s32_to_sensor_value(struct sensor_value *val, int32_t value_microX)
+{
+	val->val1 = value_microX / 1000000L;
+	val->val2 = value_microX % 1000000L;
+}
+
 static int ina237_channel_get(const struct device *dev, enum sensor_channel chan,
 			      struct sensor_value *val)
 {
-	struct ina237_data *data = dev->data;
+	const struct ina237_data *data = dev->data;
 	const struct ina237_config *config = dev->config;
-	uint32_t bus_uv, current_ua, power_uw;
-	int32_t temp_uDegC;
-	int32_t sign = 1;
 
 	switch (chan) {
 	case SENSOR_CHAN_VOLTAGE:
-		bus_uv = INA237_BUS_VOLTAGE_TO_uV(data->bus_voltage);
-
-		val->val1 = bus_uv / 1000000U;
-		val->val2 = bus_uv % 1000000U;
+		micro_s32_to_sensor_value(val, INA237_BUS_VOLTAGE_TO_uV(data->bus_voltage));
 		break;
 
 	case SENSOR_CHAN_CURRENT:
-		if (data->current & INA23X_CURRENT_SIGN_BIT) {
-			current_ua = ~data->current + 1U;
-			sign = -1;
-		} else {
-			current_ua = data->current;
-			sign = 1;
-		}
-
 		/* see datasheet "Current and Power calculations" section */
-		current_ua = current_ua * config->current_lsb;
-
-		/* convert to fractional amperes */
-		val->val1 = sign * (int32_t)(current_ua / 1000000U);
-		val->val2 = sign * (int32_t)(current_ua % 1000000U);
+		micro_s32_to_sensor_value(val, data->current * config->current_lsb);
 		break;
 
 	case SENSOR_CHAN_POWER:
 		/* see datasheet "Current and Power calculations" section */
-		power_uw = (data->power * INA237_POWER_SCALING * config->current_lsb) / 10000U;
-
-		/* convert to fractional watts */
-		val->val1 = (int32_t)(power_uw / 1000000U);
-		val->val2 = (int32_t)(power_uw % 1000000U);
+		micro_s32_to_sensor_value(val,
+			(data->power * INA237_POWER_SCALING * config->current_lsb) / 10000U);
 		break;
 
 	case SENSOR_CHAN_DIE_TEMP:
-		temp_uDegC = INA237_DIETEMP_TO_uDegC(data->die_temp);
-
-		val->val1 = temp_uDegC / 1000000L;
-		val->val2 = abs(temp_uDegC) % 1000000L;
-
-		if (temp_uDegC < 0) {
-			val->val2 = -val->val2;
-		}
+		micro_s32_to_sensor_value(val, INA237_DIETEMP_TO_uDegC(data->die_temp));
 		break;
 
 	default:
diff --git a/drivers/sensor/ina23x/ina237.h b/drivers/sensor/ina23x/ina237.h
index 68b866e2f52..892700b366a 100644
--- a/drivers/sensor/ina23x/ina237.h
+++ b/drivers/sensor/ina23x/ina237.h
@@ -37,7 +37,7 @@
 
 struct ina237_data {
 	const struct device *dev;
-	uint16_t current;
+	int16_t current;
 	uint16_t bus_voltage;
 	uint32_t power;
 	int16_t die_temp;
diff --git a/tests/drivers/sensor/ina237/src/ina237_test.c b/tests/drivers/sensor/ina237/src/ina237_test.c
index 7d6747e828e..b3e1bc56849 100644
--- a/tests/drivers/sensor/ina237/src/ina237_test.c
+++ b/tests/drivers/sensor/ina237/src/ina237_test.c
@@ -44,6 +44,39 @@ ZTEST(ina237_0, test_default_config)
  *
  * @param fixture
  */
+static void test_current(struct ina237_fixture *fixture)
+{
+	/* 16-bit signed value for current register */
+	const int16_t current_reg_vectors[] = {
+		32767,
+		1000,
+		100,
+		1,
+		0,
+		-1,
+		-100,
+		-1000,
+		-32768,
+	};
+
+	for (int idx = 0; idx < ARRAY_SIZE(current_reg_vectors); idx++) {
+		struct sensor_value sensor_val;
+		int16_t current_register = current_reg_vectors[idx];
+		double current_expected_A = fixture->current_lsb_uA * 1e-6 * current_register;
+
+		/* set current reading */
+		ina237_mock_set_register(fixture->mock->data, INA237_REG_CURRENT, current_register);
+
+		/* Verify sensor value is correct */
+		zassert_ok(sensor_sample_fetch(fixture->dev));
+		zassert_ok(sensor_channel_get(fixture->dev, SENSOR_CHAN_CURRENT, &sensor_val));
+		double current_actual_A = sensor_value_to_double(&sensor_val);
+
+		zexpect_within(current_expected_A, current_actual_A, fixture->current_lsb_uA*1e-6,
+			"Expected %.6f A, got %.6f A", current_expected_A, current_actual_A);
+	}
+}
+
 static void test_bus_voltage(struct ina237_fixture *fixture)
 {
 	zassert_not_null(fixture->mock);
@@ -128,6 +161,7 @@ static struct ina237_fixture fixtures[] = {
 
 /* Create a test suite for each enabled ina237 device node */
 #define INA237_TESTS(inst) \
+	ZTEST(ina237_##inst, test_current) { test_current(&fixtures[inst]); } \
 	ZTEST(ina237_##inst, test_bus_voltage) { test_bus_voltage(&fixtures[inst]); } \
 	ZTEST(ina237_##inst, test_temperature) { test_temperature(&fixtures[inst]); } \
 	ZTEST_SUITE(ina237_##inst, NULL, NULL, NULL, NULL, NULL);