Lyle Zhu ba55e9d7c0 Bluetooth: tester: Ignore error -EBUSY of bt_conn_set_security ... The error code `-EBUSY` of `bt_conn_set_security` means the pairing/encryption procedure is ongoing. Ignore the error code. Signed-off-by: Lyle Zhu <lyle.zhu@nxp.com>		2025-04-24 10:38:45 +02:00
..
application_development	tests: fix various test ids and use existing scheme	2025-04-07 11:22:36 +02:00
arch	tests: kernel/arch: various doxygen fixes	2025-04-22 14:03:29 +02:00
benchmarks	tests: Add benchmark for IPI performance	2025-04-04 21:15:14 +02:00
bluetooth	Bluetooth: tester: Ignore error -EBUSY of bt_conn_set_security	2025-04-24 10:38:45 +02:00
boards	tests: Add BL54L15/L15u DVK support	2025-04-23 15:02:20 +02:00
boot	tests: boot: mcuboot_recovery_retention: rm OVERLAY_CONFIG	2025-04-08 22:58:43 +02:00
bsim	bluetooth: audio: Update bad code in BASS to be v1.0.1 compliant	2025-04-22 16:53:49 +02:00
cmake	cmake: yaml: improve escaping of strings with backslashes and quotes	2025-04-10 10:11:47 +02:00
crypto	mbedtls: add Kconfig to select the number of key slot in PSA Crypto core	2024-11-26 00:12:56 +01:00
ctest/base	tests: Add CTest base harness testing	2025-01-10 04:12:42 +01:00
drivers	doc: tests: drivers: i2c_target_api: correct comments for frdm_mcxn947	2025-04-23 17:54:43 +02:00
integration/kernel	Kernel: Integration test	2024-06-19 13:41:06 +02:00
kconfig	tests: kconfig: functions: Add min/max functions	2024-08-02 13:41:07 +02:00
kernel	tests: kernel: spinlock: Increase lock contention	2025-04-24 01:27:00 +02:00
lib	tests: lib: fix doxygen groups	2025-04-22 14:03:29 +02:00
misc	tests: linker: iterable_sections: Test sorting with 5 numeric characters	2025-01-22 10:40:45 +01:00
modules	tests: modules: nanopb: Test on Big Endian platform	2024-12-19 15:20:11 +01:00
net	tests: net: socket: af_packet: Extend the test suite with more tests	2025-04-17 17:23:23 +02:00
posix	tests: posix: xsi_realtime: move more tests into xsi_realtime	2025-04-23 02:15:17 +02:00
robot	tests: robot: renode: Use precise pause for UART keywords	2025-04-16 17:07:05 +02:00
subsys	tests: Add BL54L15/L15u DVK support	2025-04-23 15:02:20 +02:00
unit	Tests: Util: Add unit tests for util_eq/util_memeq	2025-04-14 16:06:38 +02:00
ztest	ztest: Fix confusing SKIP log	2025-04-04 21:16:34 +02:00
test_config.yaml	twister: tests: Add some generic driver tests to the scope	2023-11-30 19:38:50 -05:00
test_config_ci.yaml	twister: config: test on integration plaforms if defined	2025-03-19 08:51:50 -04:00
tests.dox	tests: kernel/arch: various doxygen fixes	2025-04-22 14:03:29 +02:00