The build_all tests contain an ever growing list of device drivers to
build. Ideally we minimize the number of images we build, but we
already observe that some of the tests, notably sensors, is too big
for some of our supported boards.
Rather disable an ever growing list of boards as the build_all tests
get bigger it would be better to split the tests into smaller chunks
that can reasonably be expected to run on any supported board.
We split the sensor test set into two, the division is arbitrary,
based on the name of the driver. This allows us to remove the filter
on the quark_d2000.
The current split into two groups is arbirary, in the future it is
inevitable that as the list of supported drivers grows, we will need
to further subdivied the larger tests.
Change-Id: If7ee00b3c8e1749c4c827f83d7cbc2feb70e56ad
Signed-off-by: Marcus Shawcroft <marcus.shawcroft@arm.com>
9a60286f41