tests: remove redundant build tests

i2c_quark_se_ss and dw_aio_comparator are just build tests that
enable Kconfig options and do not do anything. We have real samples
for those drivers now.

Change-Id: Ia8c0a1801b967205cc1c116a0887b46a7dc5bbbe
Signed-off-by: Anas Nashif <anas.nashif@intel.com>
This commit is contained in:
Anas Nashif 2016-02-10 18:40:01 -05:00
commit d2a31e9f10
7 changed files with 0 additions and 44 deletions

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KERNEL_TYPE = nano
BOARD ?= quark_se_devboard
SOURCE_DIR = $(ZEPHYR_BASE)/samples/synchronization/nanokernel/src/
CONF_FILE = prj.conf
include ${ZEPHYR_BASE}/Makefile.inc

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This test is used to test the DesignWare AIO/Comparator. The voltage input
pin is analog in A0 on circuit board, which maps to AIN[10] on chip.
To test:
1. Connect the A0 pin to ground via a resistor (to limit current).
Any larger then 1k Ohm would be fine.
2. Turn on the device.
3. Wait for device to boot, until "app started" line appeared.
4. Remove resistor between A0 pin and ground.
The line "*** A0, AIN[10] triggered rising." should appear.
5. Reconnect the resistor.
The line "*** A0, AIN[10] triggered falling." should appear.
6. Keep removing/inserting the resistor to your heart's content.

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# Use standard security profile. (=> no need for a random number generator)
CONFIG_AIO_COMPARATOR=y
CONFIG_AIO_DW_COMPARATOR=y

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[test]
build_only = true
tags = drivers
arch_whitelist = x86
platform_whitelist = quark_se

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KERNEL_TYPE = nano
BOARD ?= arduino_101_sss
SOURCE_DIR = $(ZEPHYR_BASE)/samples/synchronization/nanokernel/src/
CONF_FILE = prj.conf
include ${ZEPHYR_BASE}/Makefile.inc

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# Use standard security profile. (=> no need for a random number generator)
CONFIG_I2C=y
CONFIG_I2C_QUARK_SE_SS=y
CONFIG_I2C_QUARK_SE_SS_0=y

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[test]
build_only = true
tags = drivers
arch_whitelist = arc
platform_whitelist = arduino_101_sss