tests: drivers: uart: async_api: Add missing static keyword
Multiple variable in the test were missing static keyword. Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
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760bba6d24
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bc007fd53b
1 changed files with 26 additions and 26 deletions
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@ -24,12 +24,12 @@ K_SEM_DEFINE(rx_buf_coherency, 0, 255);
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K_SEM_DEFINE(rx_buf_released, 0, 1);
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K_SEM_DEFINE(rx_disabled, 0, 1);
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ZTEST_BMEM volatile bool failed_in_isr;
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static ZTEST_BMEM volatile bool failed_in_isr;
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static ZTEST_BMEM const struct device *const uart_dev =
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DEVICE_DT_GET(UART_NODE);
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static void read_abort_timeout(struct k_timer *timer);
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K_TIMER_DEFINE(read_abort_timer, read_abort_timeout, NULL);
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static K_TIMER_DEFINE(read_abort_timer, read_abort_timeout, NULL);
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static void init_test(void)
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@ -100,7 +100,7 @@ struct test_data {
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#if NOCACHE_MEM
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static struct test_data tdata __used __NOCACHE;
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#else
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ZTEST_BMEM struct test_data tdata;
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static ZTEST_BMEM struct test_data tdata;
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#endif /* NOCACHE_MEM */
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static void test_single_read_callback(const struct device *dev,
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@ -331,14 +331,14 @@ static __aligned(32) uint8_t chained_read_buf_0[8] __used __NOCACHE;
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static __aligned(32) uint8_t chained_read_buf_1[8] __used __NOCACHE;
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static __aligned(32) uint8_t chained_cpy_buf[10] __used __NOCACHE;
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#else
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ZTEST_BMEM uint8_t chained_read_buf_0[8];
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ZTEST_BMEM uint8_t chained_read_buf_1[8];
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ZTEST_BMEM uint8_t chained_cpy_buf[10];
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static ZTEST_BMEM uint8_t chained_read_buf_0[8];
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static ZTEST_BMEM uint8_t chained_read_buf_1[8];
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static ZTEST_BMEM uint8_t chained_cpy_buf[10];
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#endif /* NOCACHE_MEM */
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ZTEST_BMEM volatile uint8_t rx_data_idx;
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ZTEST_BMEM uint8_t rx_buf_idx;
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static ZTEST_BMEM volatile uint8_t rx_data_idx;
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static ZTEST_BMEM uint8_t rx_buf_idx;
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ZTEST_BMEM uint8_t *read_ptr;
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static ZTEST_BMEM uint8_t *read_ptr;
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static uint8_t *chained_read_buf[2] = {chained_read_buf_0, chained_read_buf_1};
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@ -422,9 +422,9 @@ ZTEST_USER(uart_async_chain_read, test_chained_read)
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#if NOCACHE_MEM
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static __aligned(32) uint8_t double_buffer[2][12] __used __NOCACHE;
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#else
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ZTEST_BMEM uint8_t double_buffer[2][12];
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static ZTEST_BMEM uint8_t double_buffer[2][12];
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#endif /* NOCACHE_MEM */
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ZTEST_DMEM uint8_t *next_buf = double_buffer[1];
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static ZTEST_DMEM uint8_t *next_buf = double_buffer[1];
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static void test_double_buffer_callback(const struct device *dev,
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struct uart_event *evt, void *user_data)
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@ -497,10 +497,10 @@ ZTEST_USER(uart_async_double_buf, test_double_buffer)
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static __aligned(32) uint8_t test_read_abort_rx_buf[2][100] __used __NOCACHE;
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static __aligned(32) uint8_t test_read_abort_read_buf[100] __used __NOCACHE;
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#else
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ZTEST_BMEM uint8_t test_read_abort_rx_buf[2][100];
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ZTEST_BMEM uint8_t test_read_abort_read_buf[100];
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static ZTEST_BMEM uint8_t test_read_abort_rx_buf[2][100];
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static ZTEST_BMEM uint8_t test_read_abort_read_buf[100];
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#endif /* NOCACHE_MEM */
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ZTEST_BMEM int test_read_abort_rx_cnt;
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static ZTEST_BMEM int test_read_abort_rx_cnt;
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static void test_read_abort_callback(const struct device *dev,
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struct uart_event *evt, void *user_data)
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@ -613,12 +613,12 @@ ZTEST_USER(uart_async_read_abort, test_read_abort)
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}
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ZTEST_BMEM volatile size_t sent;
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ZTEST_BMEM volatile size_t received;
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static ZTEST_BMEM volatile size_t sent;
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static ZTEST_BMEM volatile size_t received;
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#if NOCACHE_MEM
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static __aligned(32) uint8_t test_rx_buf[2][100] __used __NOCACHE;
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#else
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ZTEST_BMEM uint8_t test_rx_buf[2][100];
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static ZTEST_BMEM uint8_t test_rx_buf[2][100];
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#endif /* NOCACHE_MEM */
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static void test_write_abort_callback(const struct device *dev,
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@ -776,12 +776,12 @@ ZTEST_USER(uart_async_timeout, test_forever_timeout)
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#if NOCACHE_MEM
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const uint8_t chained_write_tx_bufs[2][10] = {"Message 1", "Message 2"};
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static const uint8_t chained_write_tx_bufs[2][10] = {"Message 1", "Message 2"};
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#else
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ZTEST_DMEM uint8_t chained_write_tx_bufs[2][10] = {"Message 1", "Message 2"};
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static ZTEST_DMEM uint8_t chained_write_tx_bufs[2][10] = {"Message 1", "Message 2"};
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#endif /* NOCACHE_MEM */
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ZTEST_DMEM bool chained_write_next_buf = true;
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ZTEST_BMEM volatile uint8_t tx_sent;
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static ZTEST_DMEM bool chained_write_next_buf = true;
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static ZTEST_BMEM volatile uint8_t tx_sent;
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static void test_chained_write_callback(const struct device *dev,
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struct uart_event *evt, void *user_data)
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@ -863,12 +863,12 @@ static __aligned(32) uint8_t long_rx_buf[RX_LONG_BUFFER] __used __NOCACHE;
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static __aligned(32) uint8_t long_rx_buf2[RX_LONG_BUFFER] __used __NOCACHE;
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static __aligned(32) uint8_t long_tx_buf[TX_LONG_BUFFER] __used __NOCACHE;
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#else
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ZTEST_BMEM uint8_t long_rx_buf[RX_LONG_BUFFER];
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ZTEST_BMEM uint8_t long_rx_buf2[RX_LONG_BUFFER];
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ZTEST_BMEM uint8_t long_tx_buf[TX_LONG_BUFFER];
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static ZTEST_BMEM uint8_t long_rx_buf[RX_LONG_BUFFER];
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static ZTEST_BMEM uint8_t long_rx_buf2[RX_LONG_BUFFER];
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static ZTEST_BMEM uint8_t long_tx_buf[TX_LONG_BUFFER];
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#endif /* NOCACHE_MEM */
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ZTEST_BMEM volatile uint8_t evt_num;
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ZTEST_BMEM size_t long_received[2];
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static ZTEST_BMEM volatile uint8_t evt_num;
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static ZTEST_BMEM size_t long_received[2];
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static void test_long_buffers_callback(const struct device *dev,
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struct uart_event *evt, void *user_data)
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