tests: drivers: uart: async_api: Add missing static keyword

Multiple variable in the test were missing static keyword.

Signed-off-by: Krzysztof Chruściński <krzysztof.chruscinski@nordicsemi.no>
This commit is contained in:
Krzysztof Chruściński 2024-07-18 14:37:44 +02:00 committed by Henrik Brix Andersen
commit bc007fd53b

View file

@ -24,12 +24,12 @@ K_SEM_DEFINE(rx_buf_coherency, 0, 255);
K_SEM_DEFINE(rx_buf_released, 0, 1);
K_SEM_DEFINE(rx_disabled, 0, 1);
ZTEST_BMEM volatile bool failed_in_isr;
static ZTEST_BMEM volatile bool failed_in_isr;
static ZTEST_BMEM const struct device *const uart_dev =
DEVICE_DT_GET(UART_NODE);
static void read_abort_timeout(struct k_timer *timer);
K_TIMER_DEFINE(read_abort_timer, read_abort_timeout, NULL);
static K_TIMER_DEFINE(read_abort_timer, read_abort_timeout, NULL);
static void init_test(void)
@ -100,7 +100,7 @@ struct test_data {
#if NOCACHE_MEM
static struct test_data tdata __used __NOCACHE;
#else
ZTEST_BMEM struct test_data tdata;
static ZTEST_BMEM struct test_data tdata;
#endif /* NOCACHE_MEM */
static void test_single_read_callback(const struct device *dev,
@ -331,14 +331,14 @@ static __aligned(32) uint8_t chained_read_buf_0[8] __used __NOCACHE;
static __aligned(32) uint8_t chained_read_buf_1[8] __used __NOCACHE;
static __aligned(32) uint8_t chained_cpy_buf[10] __used __NOCACHE;
#else
ZTEST_BMEM uint8_t chained_read_buf_0[8];
ZTEST_BMEM uint8_t chained_read_buf_1[8];
ZTEST_BMEM uint8_t chained_cpy_buf[10];
static ZTEST_BMEM uint8_t chained_read_buf_0[8];
static ZTEST_BMEM uint8_t chained_read_buf_1[8];
static ZTEST_BMEM uint8_t chained_cpy_buf[10];
#endif /* NOCACHE_MEM */
ZTEST_BMEM volatile uint8_t rx_data_idx;
ZTEST_BMEM uint8_t rx_buf_idx;
static ZTEST_BMEM volatile uint8_t rx_data_idx;
static ZTEST_BMEM uint8_t rx_buf_idx;
ZTEST_BMEM uint8_t *read_ptr;
static ZTEST_BMEM uint8_t *read_ptr;
static uint8_t *chained_read_buf[2] = {chained_read_buf_0, chained_read_buf_1};
@ -422,9 +422,9 @@ ZTEST_USER(uart_async_chain_read, test_chained_read)
#if NOCACHE_MEM
static __aligned(32) uint8_t double_buffer[2][12] __used __NOCACHE;
#else
ZTEST_BMEM uint8_t double_buffer[2][12];
static ZTEST_BMEM uint8_t double_buffer[2][12];
#endif /* NOCACHE_MEM */
ZTEST_DMEM uint8_t *next_buf = double_buffer[1];
static ZTEST_DMEM uint8_t *next_buf = double_buffer[1];
static void test_double_buffer_callback(const struct device *dev,
struct uart_event *evt, void *user_data)
@ -497,10 +497,10 @@ ZTEST_USER(uart_async_double_buf, test_double_buffer)
static __aligned(32) uint8_t test_read_abort_rx_buf[2][100] __used __NOCACHE;
static __aligned(32) uint8_t test_read_abort_read_buf[100] __used __NOCACHE;
#else
ZTEST_BMEM uint8_t test_read_abort_rx_buf[2][100];
ZTEST_BMEM uint8_t test_read_abort_read_buf[100];
static ZTEST_BMEM uint8_t test_read_abort_rx_buf[2][100];
static ZTEST_BMEM uint8_t test_read_abort_read_buf[100];
#endif /* NOCACHE_MEM */
ZTEST_BMEM int test_read_abort_rx_cnt;
static ZTEST_BMEM int test_read_abort_rx_cnt;
static void test_read_abort_callback(const struct device *dev,
struct uart_event *evt, void *user_data)
@ -613,12 +613,12 @@ ZTEST_USER(uart_async_read_abort, test_read_abort)
}
ZTEST_BMEM volatile size_t sent;
ZTEST_BMEM volatile size_t received;
static ZTEST_BMEM volatile size_t sent;
static ZTEST_BMEM volatile size_t received;
#if NOCACHE_MEM
static __aligned(32) uint8_t test_rx_buf[2][100] __used __NOCACHE;
#else
ZTEST_BMEM uint8_t test_rx_buf[2][100];
static ZTEST_BMEM uint8_t test_rx_buf[2][100];
#endif /* NOCACHE_MEM */
static void test_write_abort_callback(const struct device *dev,
@ -776,12 +776,12 @@ ZTEST_USER(uart_async_timeout, test_forever_timeout)
#if NOCACHE_MEM
const uint8_t chained_write_tx_bufs[2][10] = {"Message 1", "Message 2"};
static const uint8_t chained_write_tx_bufs[2][10] = {"Message 1", "Message 2"};
#else
ZTEST_DMEM uint8_t chained_write_tx_bufs[2][10] = {"Message 1", "Message 2"};
static ZTEST_DMEM uint8_t chained_write_tx_bufs[2][10] = {"Message 1", "Message 2"};
#endif /* NOCACHE_MEM */
ZTEST_DMEM bool chained_write_next_buf = true;
ZTEST_BMEM volatile uint8_t tx_sent;
static ZTEST_DMEM bool chained_write_next_buf = true;
static ZTEST_BMEM volatile uint8_t tx_sent;
static void test_chained_write_callback(const struct device *dev,
struct uart_event *evt, void *user_data)
@ -863,12 +863,12 @@ static __aligned(32) uint8_t long_rx_buf[RX_LONG_BUFFER] __used __NOCACHE;
static __aligned(32) uint8_t long_rx_buf2[RX_LONG_BUFFER] __used __NOCACHE;
static __aligned(32) uint8_t long_tx_buf[TX_LONG_BUFFER] __used __NOCACHE;
#else
ZTEST_BMEM uint8_t long_rx_buf[RX_LONG_BUFFER];
ZTEST_BMEM uint8_t long_rx_buf2[RX_LONG_BUFFER];
ZTEST_BMEM uint8_t long_tx_buf[TX_LONG_BUFFER];
static ZTEST_BMEM uint8_t long_rx_buf[RX_LONG_BUFFER];
static ZTEST_BMEM uint8_t long_rx_buf2[RX_LONG_BUFFER];
static ZTEST_BMEM uint8_t long_tx_buf[TX_LONG_BUFFER];
#endif /* NOCACHE_MEM */
ZTEST_BMEM volatile uint8_t evt_num;
ZTEST_BMEM size_t long_received[2];
static ZTEST_BMEM volatile uint8_t evt_num;
static ZTEST_BMEM size_t long_received[2];
static void test_long_buffers_callback(const struct device *dev,
struct uart_event *evt, void *user_data)