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tests: subsys: sd cases move to new ztest API

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Move test to use new ztest API.

Signed-off-by: NingX Zhao <ningx.zhao@intel.com>
This commit is contained in:
NingX Zhao 2022-07-11 09:38:06 +08:00 • committed by Carles Cufí
commit 553a4de3c9
2 changed files with 8 additions and 20 deletions
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1
tests/subsys/sd/sdmmc/prj.conf
View file

@ -3,3 +3,4 @@ CONFIG_ZTEST=y
CONFIG_SDHC=y
CONFIG_SD_STACK=y
CONFIG_LOG=y
CONFIG_ZTEST_NEW_API=y

27
tests/subsys/sd/sdmmc/src/main.c
View file

@ -25,7 +25,7 @@ static uint32_t sector_count;
/* Verify that SD stack can initialize an SD card */
static void test_init(void)
ZTEST(sd_stack, test_init)
{
int ret;
@ -40,7 +40,7 @@ static void test_init(void)
}
/* Verify that SD stack returns valid IOCTL values */
static void test_ioctl(void)
ZTEST(sd_stack, test_ioctl)
{
int ret;
@ -55,7 +55,7 @@ static void test_ioctl(void)
/* Verify that SD stack can read from an SD card */
static void test_read(void)
ZTEST(sd_stack, test_read)
{
int ret;
int block_addr = 0;
@ -91,7 +91,7 @@ static void test_read(void)
}
/* Verify that SD stack can write to an SD card */
static void test_write(void)
ZTEST(sd_stack, test_write)
{
int ret;
int block_addr = 0;
@ -127,7 +127,7 @@ static void test_write(void)
}
/* Test reads and writes interleaved, to verify data is making it on disk */
static void test_rw(void)
ZTEST(sd_stack, test_rw)
{
int ret;
int block_addr = 0;
@ -177,7 +177,7 @@ static void test_rw(void)
}
/* Simply dump the card configuration. */
void test_card_config(void)
ZTEST(sd_stack, test_card_config)
{
switch (card.card_voltage) {
case SD_VOL_1_2_V:
@ -241,17 +241,4 @@ void test_card_config(void)
}
}
void test_main(void)
{
ztest_test_suite(sd_stack_test,
ztest_unit_test(test_init),
ztest_unit_test(test_ioctl),
ztest_unit_test(test_read),
ztest_unit_test(test_write),
ztest_unit_test(test_rw),
ztest_unit_test(test_card_config)
);
ztest_run_test_suite(sd_stack_test);
}
ZTEST_SUITE(sd_stack, NULL, NULL, NULL, NULL, NULL);