michaelh/zephyr
1
0
Fork 0
Code Releases Activity

tests: clock_control: esp32: Fix device testing

Browse source 
Select modules which are not sensitive for testing.

Signed-off-by: Raffael Rostagno <raffael.rostagno@espressif.com>
This commit is contained in:
Raffael Rostagno 2024-09-27 17:49:45 -03:00 • committed by Alberto Escolar
commit 26314cf760
1 changed files with 8 additions and 2 deletions
Download patch file Download diff file Expand all files Collapse all files

10
tests/drivers/clock_control/clock_control_api/src/esp32_device_subsys.h
View file

@ -12,9 +12,15 @@ static const struct device_subsys_data subsys_data[] = {
{.subsys = (void *) ESP32_LEDC_MODULE},
{.subsys = (void *) ESP32_UART1_MODULE},
{.subsys = (void *) ESP32_I2C0_MODULE},
#if !defined(CONFIG_SOC_SERIES_ESP32C2)
{.subsys = (void *) ESP32_UHCI0_MODULE},
{.subsys = (void *) ESP32_RMT_MODULE},
{.subsys = (void *) ESP32_TWAI_MODULE},
#endif
#if defined(CONFIG_SOC_SERIES_ESP32C3) || defined(CONFIG_SOC_SERIES_ESP32S2) || \
defined(CONFIG_SOC_SERIES_ESP32S3)
{.subsys = (void *) ESP32_TIMG1_MODULE},
#else
{.subsys = (void *) ESP32_TIMG0_MODULE},
#endif
{.subsys = (void *) ESP32_RNG_MODULE},
};