tests: ibecc: Use LOG api instead of TC_PRINT()

Use proper LOG API instead of TC_PRINT() function for logging output.

Signed-off-by: Andrei Emeltchenko <andrei.emeltchenko@intel.com>
This commit is contained in:
Andrei Emeltchenko 2022-08-09 15:55:53 +03:00 committed by Stephanos Ioannidis
commit 1ad63d9c13

View file

@ -9,6 +9,9 @@
#include <zephyr/ztest.h>
#include <zephyr/tc_util.h>
#include <zephyr/logging/log.h>
LOG_MODULE_REGISTER(test, CONFIG_LOG_DEFAULT_LEVEL);
#include <zephyr/drivers/edac.h>
#include <ibecc.h>
@ -22,7 +25,7 @@ ZTEST(ibecc, test_ibecc_driver_initialized)
{
const struct device *dev;
TC_PRINT("Test ibecc driver is initialized\n");
LOG_DBG("Test ibecc driver is initialized");
dev = DEVICE_DT_GET(DT_NODELABEL(ibecc));
zassert_true(device_is_ready(dev), "Device is not ready");
@ -54,7 +57,7 @@ ZTEST(ibecc, test_ibecc_api)
uint64_t value;
int ret;
TC_PRINT("Test IBECC API\n");
LOG_DBG("Test IBECC API");
/* Error log API */
@ -98,7 +101,7 @@ ZTEST(ibecc, test_ibecc_error_inject_api)
Z_TEST_SKIP_IFNDEF(CONFIG_EDAC_ERROR_INJECT);
TC_PRINT("Test IBECC Inject API\n");
LOG_DBG("Test IBECC Inject API");
dev = DEVICE_DT_GET(DT_NODELABEL(ibecc));
zassert_true(device_is_ready(dev), "Device is not ready");
@ -198,18 +201,18 @@ static void test_inject(const struct device *dev, uint64_t addr, uint64_t mask,
zassert_equal(ret, 0, "Error setting ctrl");
device_map((mm_reg_t *)&test_addr, addr, 0x100, K_MEM_CACHE_NONE);
TC_PRINT("Mapped 0x%llx to 0x%llx\n", addr, test_addr);
LOG_DBG("Mapped 0x%llx to 0x%llx", addr, test_addr);
test_value = sys_read32(test_addr);
TC_PRINT("Read value 0x%llx: 0x%x\n", test_addr, test_value);
LOG_DBG("Read value 0x%llx: 0x%x", test_addr, test_value);
/* Write to this test address some data */
sys_write32(TEST_DATA, test_addr);
TC_PRINT("Wrote value 0x%x at 0x%llx\n", TEST_DATA, test_addr);
LOG_DBG("Wrote value 0x%x at 0x%llx", TEST_DATA, test_addr);
/* Read back, triggering interrupt and notification */
test_value = sys_read32(test_addr);
TC_PRINT("Read value 0x%llx: 0x%x\n", test_addr, test_value);
LOG_DBG("Read value 0x%llx: 0x%x", test_addr, test_value);
/* Wait for interrupt if needed */
k_busy_wait(USEC_PER_MSEC * DURATION);
@ -222,8 +225,8 @@ static void test_inject(const struct device *dev, uint64_t addr, uint64_t mask,
"Interrupt handler executed more than once! (%d)\n",
num_int);
TC_PRINT("Interrupt %d\n", num_int);
TC_PRINT("Error: type %u, address 0x%llx, syndrome %u\n",
LOG_DBG("Interrupt %d", num_int);
LOG_DBG("Error: type %u, address 0x%llx, syndrome %u",
error_type, error_address, error_syndrome);
/* Check statistic information */
@ -232,7 +235,7 @@ static void test_inject(const struct device *dev, uint64_t addr, uint64_t mask,
zassert_equal(ret, type == EDAC_ERROR_TYPE_DRAM_COR ?
errors_cor + 1 : errors_cor,
"Incorrect correctable count");
TC_PRINT("Correctable error count %d\n", ret);
LOG_DBG("Correctable error count %d", ret);
errors_correctable = ret;
@ -240,7 +243,7 @@ static void test_inject(const struct device *dev, uint64_t addr, uint64_t mask,
zassert_equal(ret, type == EDAC_ERROR_TYPE_DRAM_UC ?
errors_uc + 1 : errors_uc,
"Incorrect uncorrectable count");
TC_PRINT("Uncorrectable error count %d\n", ret);
LOG_DBG("Uncorrectable error count %d", ret);
errors_uncorrectable = ret;
@ -266,7 +269,7 @@ static int check_values(void *p1, void *p2, void *p3)
intptr_t addr, errtype;
#if defined(CONFIG_USERSPACE)
TC_PRINT("Test communication in user mode thread\n");
LOG_DBG("Test communication in user mode thread");
zassert_true(k_is_user_context(), "thread left in kernel mode");
#endif
@ -309,7 +312,7 @@ ZTEST(ibecc, test_ibecc_error_inject_test_cor)
{
Z_TEST_SKIP_IFNDEF(CONFIG_EDAC_ERROR_INJECT);
TC_PRINT("Test IBECC injection correctable error\n");
LOG_DBG("Test IBECC injection correctable error");
ibecc_error_inject_test(TEST_ADDRESS1, TEST_ADDRESS_MASK,
EDAC_ERROR_TYPE_DRAM_COR);
@ -319,7 +322,7 @@ ZTEST(ibecc, test_ibecc_error_inject_test_uc)
{
Z_TEST_SKIP_IFNDEF(CONFIG_EDAC_ERROR_INJECT);
TC_PRINT("Test IBECC injection uncorrectable error\n");
LOG_DBG("Test IBECC injection uncorrectable error");
ibecc_error_inject_test(TEST_ADDRESS2, TEST_ADDRESS_MASK,
EDAC_ERROR_TYPE_DRAM_UC);
@ -331,8 +334,8 @@ static void *setup_ibecc(void)
int ret = k_mem_domain_add_partition(&k_mem_domain_default,
&default_part);
if (ret != 0) {
TC_PRINT("Failed to add to mem domain (%d)\n", ret);
TC_PRINT("Running test setup function second time?\n");
LOG_ERR("Failed to add to mem domain (%d)", ret);
LOG_ERR("Running test setup function second time?");
ztest_test_fail();
}
#endif