From 132fcd0eaa96412003a6ae6e5e5fcc0876371471 Mon Sep 17 00:00:00 2001 From: Anas Nashif Date: Tue, 28 Jan 2020 09:08:52 -0500 Subject: [PATCH] samples: remove extra colon from test identifier Fix bad yaml syntax. Signed-off-by: Anas Nashif --- samples/drivers/soc_flash_nrf/sample.yaml | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/samples/drivers/soc_flash_nrf/sample.yaml b/samples/drivers/soc_flash_nrf/sample.yaml index 4c355b9d576..487958c4184 100644 --- a/samples/drivers/soc_flash_nrf/sample.yaml +++ b/samples/drivers/soc_flash_nrf/sample.yaml @@ -1,7 +1,7 @@ sample: name: SoC Flash on NRF52 tests: - sample.drivers.flash.soc_flash_nrf:: + sample.drivers.flash.soc_flash_nrf: platform_whitelist: nrf52_pca10040 nrf9160_pca10090 nrf9160_pca10090ns tags: flash nrf52 nrf9160 harness: console